Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope

Review of Scientific Instruments

Volumn 84, Issue 3, 2013, Pages

  Nazaretski, E ^a   Kim, Jungdae ^a,d   Yan, H ^a   Lauer, K ^a   Eom, D ^a,e   Shu, D ^b   Maser, J ^b   Pesic Z ^c   Wagner, U ^c   Rau, C ^c   Chu, Y S ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^d University of Ulsan   (South Korea)

^e Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE MICROSCOPES; HIGH SPATIAL RESOLUTION; MULTILAYER LAUE LENS; SCIENCE AND TECHNOLOGY; SPATIAL RESOLUTION; SUBMICROMETER RESOLUTION; TECHNICAL CHALLENGES; X RAY MICROSCOPY;

IMAGE RESOLUTION; MICROSCOPES; MULTILAYERS; X RAY MICROSCOPES;

X RAYS;

EID: 84875796902     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4774387     Document Type: Article

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