Optimization of overlap uniformness for ptychography

Optics Express

Volumn 22, Issue 10, 2014, Pages 12634-12644

  Huang, Xiaojing ^a   Yan, Hanfei ^a   Harder, Ross ^b   Hwu, Yeukuang ^c   Robinsonv, Ian K ^d,e   Chu, Yong S ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c INSTITUTE OF PHYSICS   (Taiwan)

^d UNIVERSITY COLLEGE LONDON   (United Kingdom)

^e Research Complex at Harwell   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

MEASUREMENT CONDITIONS; OVERLAP RATIOS; PERFORMANCE ENHANCEMENTS; RECONSTRUCTED IMAGE; SCAN PATTERNS; SPIRAL PATTERN; SPIRAL TRAJECTORIES; UNIFORM COVERAGE;

IMAGE RECONSTRUCTION;

EID: 84901281492     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.012634     Document Type: Article

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