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Volumn 330, Issue , 2015, Pages 74-84

Investigation of the growth conditions on the nano-structure and electrical properties of ZnS chiral sculptured thin films

Author keywords

Chiral sculptured; Electrical properties; Nano structure; Resistance; ZnS thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DEPOSITION; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; FIELD EMISSION MICROSCOPES; II-VI SEMICONDUCTORS; NANOSTRUCTURES; NUCLEATION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; VOID FRACTION; X RAY DIFFRACTION; ZINC SULFIDE;

EID: 84924060125     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.12.190     Document Type: Article
Times cited : (10)

References (58)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.