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Volumn 330, Issue , 2015, Pages 74-84
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Investigation of the growth conditions on the nano-structure and electrical properties of ZnS chiral sculptured thin films
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Author keywords
Chiral sculptured; Electrical properties; Nano structure; Resistance; ZnS thin films
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
DEPOSITION;
ELECTRIC PROPERTIES;
ELECTRIC RESISTANCE;
FIELD EMISSION MICROSCOPES;
II-VI SEMICONDUCTORS;
NANOSTRUCTURES;
NUCLEATION;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
VOID FRACTION;
X RAY DIFFRACTION;
ZINC SULFIDE;
CHIRAL SCULPTURED;
CHIRAL SCULPTURED THIN FILMS;
CRYSTALLOGRAPHIC STRUCTURE;
ELECTRICAL RESISTANCE MEASUREMENT;
ELECTRICAL RESISTANCES;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
SCULPTURED THIN FILMS;
ZNS THIN FILMS;
THIN FILMS;
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EID: 84924060125
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2014.12.190 Document Type: Article |
Times cited : (10)
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References (58)
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