Lateral shifts of optical beams on reflection by slanted chiral sculptured thin films

Optics Communications

Volumn 235, Issue 1-3, 2004, Pages 107-132

  Wang, Fei ^a   Lakhtakia, Akhlesh ^a  

^a The Pennsylvania State University   (United States)

Author keywords

Beam shift; Gaussian beam; Goos H nchen shift; Nanomaterials; Sculptured thin film; Structural handedness

Indexed keywords

NANOSTRUCTURED MATERIALS; REFRACTION; REFRACTIVE INDEX; THIN FILMS; TIME DOMAIN ANALYSIS;

BEAM SHIFT; GAUSSIAN BEAMS; GOOS-HÄNCHEN SHIFT; SCULPTURED THIN FILMS; STRUCTURAL HANDEDNESS;

LIGHT REFLECTION;

EID: 1842761755     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.02.050     Document Type: Article

References (41)

1. de Fornel F. Evanescent Waves: From Newtonian Optics to Atomic Optics. 2000;Springer, Heidelberg, Germany.
2. Lotsch H.K.V. Optik. 32:1970;189.
3. Lakhtakia A. Proc. SPIE. 5218:2003;29.
4. Messier R., Venugopal V.C., Sunal P.D. J. Vac. Sci. Technol. B. 18:2000;1538.
5. Hodgkinson I.J., Wu Q.h. Adv. Mater. 13:2001;889.
6. Messier R., Lakhtakia A. Mater. Res. Innovat. 2:1999;217.
7. Venugopal V.C., Lakhtakia A. Singh O.N., Lakhtakia A. Electromagnetic Fields in Unconventional Materials and Structures. 2000;Wiley, New York, NY, USA. (Chapter 5).
8. Lakhtakia A., Weiglhofer W.S. Proc. R. Soc. Lond. A. 448:1995;419. corrections: 454 (1998) 3275.
9. Venugopal V.C., Lakhtakia A. Proc. R. Soc. Lond. A. 456:2000;125.
10. Wang J., Lakhtakia A., Geddes J.B. III Optik. 113:2002;213.
11. Lakhtakia A., Messier R. Weiglhofer W.S., Lakhtakia A. Introduction to Complex Mediums for Optics and Electromagnetics. 2003;447-478 SPIE Press, Bellingham, WA, USA.
12. McCall M.W. Weiglhofer W.S., Lakhtakia A. Introduction to Complex Mediums for Optics and Electromagnetics. 2003;479-506 SPIE Press, Bellingham, WA, USA.
13. Messier R., Lakhtakia A., Venugopal V.C., Sunal P.D. Vac. Technol. Coating. 2(10):2001;40.
14. Wang F., Lakhtakia A., Messier R. Eur. Phys. J. Appl. Phys. 20:2002;91. corrections: 24 (2003) 91.
15. Meecham W.C. J. Appl. Phys. 27:1956;361.
16. Maystre D. Selected Papers on Diffraction Gratings. 1993;SPIE Press, Bellingham, WA.
17. Wang F., Lakhtakia A. Opt. Commun. 215:2003;79.
18. Moharam M.G., Grann E.B., Pommet D.A., Gaylord T.K. J. Opt. Soc. Am. A. 12:1995;1068.
19. Moharam M.G., Pommet D.A., Grann E.B., Gaylord T.K. J. Opt. Soc. Am. A. 12:1995;1077.
20. Chateau N., Hugonin J. J. Opt. Soc. Am. A. 11:1994;1321.
21. Hodgkinson I.J., Wu Q.h., Knight B., Lakhtakia A., Robbie K. Appl. Opt. 39:2000;642.
22. Hodgkinson I., Wu Q.h. Appl. Opt. 38:1999;3621.
23. Kittel C. Introduction to Solid State Physics. fourth ed. 1974;Wiley Eastern, New Delhi, India. (Chapter 13).
24. Bohren C.F., Huffman D.R. Absorption and Scattering of Light by Small Particles. 1983;Wiley, New York, NY USA. 247-251.
25. Kong J.A. Electromagnetic Wave Theory. 1986;Wiley, New York, NY, USA.
26. Hochstadt H. Differential Equations: A Modern Approach. 1975;Dover Press, New York, NY, USA.
27. Li L. J. Opt. Soc. Am. A. 10:1993;2581.
28. Wang F., Horn M.W., Lakhtakia A. Microelectron. Eng. 71:2004;34.
29. Jaluria Y. Computer Methods for Engineering. 1996;Taylor & Francis, Washington, DC, USA.
30. Clemmow P.C. The Plane Wave Spectrum Representation of Electromagnetic Fields. 1956;Pergamon Press, New York, NY, USA.
31. Peng S., Morris G.M. J. Opt. Soc. Am. A. 13:1996;993.
32. Lakhtakia A., McCall M.W. Arch. Elektr. Übertr. 57:2003;23.
33. Baida F.I., Van Labeke D., Vigoureux J.M. J. Opt. Soc. Am. A. 17:2000;858.
34. Lekner J. J. Opt. A: Pure Appl. Opt. 5:2003;6.
35. Venugopal V.C., Lakhtakia A. Eur. Phys. J. Appl. Phys. 10:2000;173.
36. Lakhtakia A. Arch. Elektr. Übertr. 56:2002;169. corrections: 57 (2003) 79.
37. Haus H.A. Waves and Fields in Optoelectronics. 1984;Prentice-Hall, Englewood Cliffs, NJ, USA. (Chapter 5).
38. Wild W.J., Giles C.L. Phys. Rev. A. 25:1982;2099.
39. Lakhtakia A. Electromagnetics. 23:2003;71.
40. Haibel A., Nimtz G., Stahlhofen A.A. Phys. Rev. E. 63:2001;047601.
41. Stoneham A.M. Mater. Sci. Eng. C. 23:2003;235.