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Volumn 120, Issue 1-2, 1997, Pages 58-64

Thin multilayer CdS/ZnS films grown by SILAR technique

Author keywords

CdS; Multilayer; SILAR method; Thin film; ZnS

Indexed keywords

ADSORPTION; ANNEALING; CRYSTAL STRUCTURE; GLASS; MULTILAYERS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; X RAY DIFFRACTION ANALYSIS; ZINC SULFIDE;

EID: 0031277125     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00248-1     Document Type: Article
Times cited : (48)

References (26)
  • 24
    • 0012832380 scopus 로고
    • International Centre for Diffraction Data, Dataware Technologies, PA, USA
    • Powder Diffraction File 1994, PDF-2 Database Sets 1-44, International Centre for Diffraction Data, Dataware Technologies, PA, USA, 1994.
    • (1994) Powder Diffraction File 1994, PDF-2 Database Sets 1-44


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.