Tomography Using Magnifying Optics

Advanced Tomographic Methods in Materials Research and Engineering

Volumn 9780199213245, Issue , 2008, Pages

  Suzuki, Yoshio ^a   Toda, Hiroyuki ^b   Schroer, Christian ^c  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Fresnel zone plate microscopy; FZP microscope; Hard x rays; Microtomography

Indexed keywords

CONDENSED MATTER PHYSICS; ENGINEERING; INDUSTRIAL ENGINEERING; MATERIALS SCIENCE;

FRESNEL ZONE PLATE; HARD X RAY; IMAGING PROPERTIES; MATERIALS RESEARCH; MICRO-TOMOGRAPHY; TOMOGRAPHIC; TOMOGRAPHIC IMAGING; X RAY MICROSCOPY;

TOMOGRAPHY;

EID: 84922760606     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1093/acprof:oso/9780199213245.003.0007     Document Type: Chapter

References (27)

1. Born, M. and Wolf, E. (1980). Principles of optics. Cambridge University Press, Cambridge.
2. Hignette, O., Cloetens, P., Morawe, C., Borel, C., and Ludwig, W. (2007). Nanofocusing at ESRF using graded multilayer mirrors. In Synchrotron Radiation Instrumentation: Ninth International Conference on Synchrotron Radiation Instrumentation (ed. J.-Y. Choi and S. Rah), Volume 879 of AIP Conference Proceedings, pp. 792. American Institute of Physics.
3. Hignette, O., Cloetens, P., Rostaing, G., Bernard, P., and Morawe, C. (2005). Efficient sub 100 nm focusing of hard X-rays. Review of Scientific Instruments, 76, 063709.
4. Kang, H.C., Maser, J., Stephenson, G.B., Liu, C., Conley, R., Macrander, A.T., and Vogt, S. (2006). Nanometer linear focusing of hard X-rays by a multilayer Laue lens. Physical Review Letters, 96, 127401.
5. Kirkpatrick, P. and Baez, A. (1948). Formation of optical images by X-rays. Journal of the Optical Society of America, 38, 766.
6. Lengeler, B., Schroer, C.G., Kuhlmann, M., Benner, B., Günzler, T.F., Kurapova, O., Zontone, F., Snigirev, A., and Snigireva, I. (2005). Refractive X-ray lenses. Journal of Physics D: Applied Physics, 38, A218.
7. Lengeler, B., Schroer, C.G., Richwin, M., Tümmler, J., Drakopoulos, M., Snigirev, A., and Snigireva, I. (1999a). A microscope for hard X-rays based on parabolic compound refractive lenses. Applied Physics Letters, 74, 3924.
8. Lengeler, B., Schroer, C., Tümmler, J., Benner, B., Richwin, M., Snigirev, A., Snigireva, I., and Drakopoulos, M. (1999b). Imaging by parabolic refractive lenses in the hard X-ray range. Journal of Synchrotron Radiation, 6, 1153.
9. Michette, A. (1986). Optical system for soft X-rays. Plenum Press, New York.
10. Mimura, H., Matsuyama, S., Yumoto, H., Yamamura, K., Sano, Y., Shibahara, M., Endo, K., Mori, Y., Nishino, Y., Tamasaku, K., Yabashi, M., Ishikawa, T., and Yamauchi, K. (2005). Hard X-ray diffraction-limited nanofocusing with Kirkpatrick-Baez mirrors. Japanese Journal of Applied Physics, 44, L539.
11. Moore, K.T. and Howe, J.M. (2000). Characterization of gamma plate-shaped precipitates in an Al-4.2 at.% Ag alloy: Growth kinetics, solute field, composition, and modeling. Acta Materialia, 48, 4083.
12. Nieman, B., Guttmann, P., Hambach, D., Schneider, G., Wei, D., and Schmahl, G. (2000). The condenser-monochromator with dynamical aperture synthesis for the TXM at an undulator beamline at BESSY II. In X-ray microscopy (ed. W. Meyer-Ilse, T. Warwick, D. Attwood, and E. Orlando), Volume 507, pp. 440. Proceedings of the VI International Conference, Berkeley, 2.-6.8.1999.
13. Nishido, S., Kaneso, M., Kobayashi, T., and Toda, H. (2004). Role of Si particle damage on fatigue characteristics of cast Al-Si alloys. International Journal of Cast Metals Research, 17, 345.
14. Schäfer, P. and Köhler, R. (2003). Asymmetric Bragg reflection as X-ray magnifyer. Journal of Physics D: Applied Physics, 36, A113.
15. Schroer, C.G., Kurapova, O., Patommel, J., Boye, P., Feldkamp, J., Lengeler, B., Burghammer, M., Riekel, C., Vincze, L., van der Hart, A., and Küchler, M. (2005). Hard X-ray nanoprobe based on refractive X-ray lenses. Applied Physics Letters, 87, 124103.
16. Schroer, C.G., Meyer, J., Kuhlmann, M., Benner, B., Günzler, T.F., Lengeler, B., Rau, C., Weitkamp, T., A. Snigirev, and Snigireva, I. (2002). Nanotomography based on hard X-ray microscopy with refractive lenses. Applied Physics Letters, 81, 1527.
17. Suzuki, Y., Takeuchi, A., Takano, H., Ohigashi, T., and Takenaka, H. (2001). Diffractionlimited microbeam with Fresnel zone plate optics in hard X-ray regions. Japanese Journal of Applied Physics, 40, 1508.
18. Suzuki, Y., Takeuchi, A., Takano, H., and Takenaka, H. (2005). Performance test of Fresnel zone plate with 50 nm outermost zone width in hard X-ray region. Japanese Journal of Applied Physics, 44, 1994.
19. Takano, H., Suzuki, Y., and Takeuchi, A. (2003). Sub-100 nm hard X-ray microbeam generation with Fresnel zone plate optics. Japanese Journal of Applied Physics, 43, L132.
20. Takeuchi, A., Uesugi, K., Suzuki, Y., and Aoki, S. (2001). Hard X-ray microtomography using X-ray imaging optics. Japanese Journal of Applied Physics, 40, 1499.
21. Takeuchi, A., Uesugi, K., Takano, H., and Suzuki, Y. (2002). Submicrometer-resolution three-dimensional imaging with hard X-ray imaging microtomography. Review of Scientific Instruments, 73, 4246.
22. Tamura, S., Yasumoto, M., Kamijo, N., Suzuki, Y., Awaji, M., Takeuchi, A., Takano, H., and Handa, K. (2002). Development of multilayer Fresnel zone plate for high-energy synchrotron radiation X-rays by DC sputtering deposition. Journal of Synchrotron Radiation, 9, 154.
23. Toda, H., Minami, K., Kobayashi, M., Uesugi, K., and Kobayashi, T. (2006a). Observation of precipitates in aluminum alloys by sub-micrometer resolution tomography using Fresnel zone plate. Materials Science Forum, 519-521, 1361.
24. Toda, H., Ohgaki, T., Uesugi, K., Kobayashi, M., Kuroda, N., Kobayashi, T., Niinomi, M., Akahori, T., Makii, K., and Aruga, Y. (2006b). Quantitative assessment of microstructure and its effects on compression behaviour of aluminium foams via high-resolution synchrotron X-ray tomography. Metallurgical and Materials Transactions A, 37, 1211.
25. Toda, H., Uesugi, K., Takeuchi, A., Minami, K., Kobayashi, M., and Kobayashi, T. (2006c). Three-dimensional observation of nanoscopic precipitates in an aluminum alloy by microtomography with Fresnel zone plate optics. Applied Physics Letters, 89, 143112.
26. Uesugi, K., Takeuchi, A., and Suzuki, Y. (2006). Development of micro-tomography system with Fresnel zone plate optics at SpRing8. In Developments in X-ray tomography V (ed. U. Bonse), Volume 6318, pp. 154. SPIE. Proceedings of SPIE International Conference, San Diego, 15.08.2006.
27. Weiss, D., Schneider, G., Nieman, B., Guttmann, P., Rudolph, D., and Schmahl, G. (2000). Computed tomography of cryogenic biological specimens based on X-ray microscopic images. Ultramicroscopy, 84, 185.