Asymmetric Bragg reflection as x-ray magnifier

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Schafer P ^a   Kohler R ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; FINITE ELEMENT METHOD; IMAGING TECHNIQUES; LATTICE CONSTANTS; LIGHT REFLECTION; MATRIX ALGEBRA; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SYNCHROTRON RADIATION; X RAYS;

ASYMMETRIC BRAGG REFLECTION; MAGNIFICATION MATRIX; X RAY IMAGING; X RAY MAGNIFIER;

RADIATION DETECTORS;

EID: 0037945670     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10a/323     Document Type: Article

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