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Volumn 15, Issue 1, 2015, Pages 80-87

Topological properties determined by atomic buckling in self-assembled ultrathin Bi(110)

Author keywords

atomic buckling; Bi(110); edge states; electron doping; topological insulator

Indexed keywords

ATOMS; BUCKLING; CALCULATIONS; ELECTRIC INSULATORS; ENERGY GAP; LOCKS (FASTENERS); SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DOPING; ULTRATHIN FILMS;

EID: 84921057274     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl502997v     Document Type: Article
Times cited : (234)

References (41)
  • 38


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.