STM and XPS investigations of bismuth islands on HOPG

Surface Science

Volumn 605, Issue 7-8, 2011, Pages 659-667

  Kowalczyk, P J ^a,b   Mahapatra, O ^a   McCarthy, D N ^a   Kozlowski, W ^b   Klusek, Z ^b   Brown, S A ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

^b UNIVERSITY OF LODZ   (Poland)

Author keywords

Bismuth; Nanostructures; Scanning tunneling microscopy; Thin films; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC RESOLUTION IMAGES; ATOMIC ROWS; BI-LAYER; BISMUTH FILM; BISMUTH THIN FILMS; BULK UNIT CELL; CRYSTALLOGRAPHIC ORIENTATIONS; DEPOSITED FILMS; FERMI EDGE; GROWTH DIRECTIONS; HIGHLY ORIENTED PYROLITIC GRAPHITES; INTERMEDIATE LAYERS; PLASMON ENERGY; PREFERENTIAL ATTACHMENTS; QUANTUM WELL; SCANNING TUNNELING MICROSCOPY (STM); SEM; SUB-BANDS; SUBSTRATE TEMPERATURE; SURFACE COVERAGES; SURFACE UNITS; WEAK BONDING; XPS; ZIG-ZAG;

ATOMS; CRYSTAL ATOMIC STRUCTURE; ELECTRONS; NANOSTRUCTURES; PHOSPHORUS; PHOTOELECTRICITY; PHOTONS; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

BISMUTH;

EID: 79952361540     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.12.032     Document Type: Article

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