Electronic size effects in three-dimensional nanostructures

Nano Letters

Volumn 13, Issue 1, 2013, Pages 43-47

  Kowalczyk, P J ^a,b   Mahapatra, O ^a   Brown, S A ^a   Bian, G ^c   Wang, X ^c,d   Chiang, T C ^c  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

^b UNIVERSITY OF LODZ   (Poland)

^c University of Illinois at Urbana Champaign   (United States)

^d NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

bismuth; nanostructures; Quantum size effects; thin films

Indexed keywords

ELECTRONIC EFFECTS; FERMI SURFACE TOPOLOGY; FIRST-PRINCIPLES CALCULATION; LATERAL DIMENSION; QUANTUM SIZE EFFECTS; SIZE EFFECTS; THREE-DIMENSIONAL NANOSTRUCTURES; THREE-DIMENSIONAL PATTERNS;

BISMUTH; CALCULATIONS; SCANNING TUNNELING MICROSCOPY; THIN FILMS; THREE DIMENSIONAL;

NANOSTRUCTURES;

EID: 84872109612     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl3033119     Document Type: Article

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