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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 12, 2011, Pages

Localized edge states in two-dimensional topological insulators: Ultrathin Bi films

(4) Wada, M a Murakami, S a,b Freimuth, F c Bihlmayer, G c

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961074112 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.121310 Document Type: Article

Times cited : (365)

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