Chemical composition mapping with nanometre resolution by soft X-ray microscopy

Nature Photonics

Volumn 8, Issue 10, 2014, Pages 765-769

  Shapiro, David A ^a   Yu, Young Sang ^a,b   Tyliszczak, Tolek ^a   Cabana, Jordi ^a,c   Celestre, Rich ^a   Chao, Weilun ^a   Kaznatcheev, Konstantin ^d   Kilcoyne, A L David ^a   Maia, Filipe ^e   Marchesini, Stefano ^a   Meng, Y Shirley ^b   Warwick, Tony ^a   Yang, Lee Lisheng ^a   Padmore, Howard A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA SAN DIEGO   (United States)

^c UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

^e UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

LITHIUM COMPOUNDS; REFRACTIVE INDEX;

CHEMICAL COMPONENT; CHEMICAL COMPOSITIONS; COMPLEX REFRACTIVE INDEX; ELECTROCHEMICAL ENERGY STORAGE; HIGH SPATIAL RESOLUTION; HIGHEST RESOLUTIONS; NANOMETRE RESOLUTION; SOFT X-RAY MICROSCOPY;

X RAY MICROSCOPES;

EID: 84921030350     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2014.207     Document Type: Article

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