Ultrahigh-Resolution Soft-X-Ray Microscopy with Zone Plates in High Orders of Diffraction

Physical Review Letters

Volumn 103, Issue 11, 2009, Pages

  Rehbein, S ^a   Heim, S ^a   Guttmann, P ^a   Werner, S ^a   Schneider, G ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LIMITATION; ENERGY RESOLUTIONS; FULL-FIELD; HIGH ORDER; REAL-SPACE; SOFT X-RAY MICROSCOPY; SPATIAL RESOLUTION; TEST STRUCTURE; THIRD ORDER; XRAY IMAGING; ZONE PLATES;

DIFFRACTION; OPTICAL INSTRUMENTS; PLATES (STRUCTURAL COMPONENTS); X RAYS;

X RAY MICROSCOPES;

EID: 70249142824     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.103.110801     Document Type: Article

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