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Journal of Alloys and Compounds

Volumn 626, Issue , 2015, Pages 154-157

Porosity-induced relaxation of strains at different depth of nanoporous GaN studied using the Z-scan of Raman spectroscopy

(5) Cui, Jishi a Xiao, Hongdi a Cao, Dezhong a Ji, Ziwu a Ma, Jin a

a SHANDONG UNIVERSITY (China)

Author keywords

Nanoporous GaN; Porosity; Raman spectroscopy; Strain relaxation

Indexed keywords

NANOPORES; POROSITY; RAMAN SPECTROSCOPY; STRAIN; STRAIN RELAXATION;

AS-GROWN; CROSS-SECTIONAL SCANNING; DESTRUCTIVE METHODS; NANOPOROUS GAN; NON DESTRUCTIVE; POROSITY CHANGES; POROUS FILM; QUALITATIVE STUDY;

GALLIUM NITRIDE;

EID: 84918815293 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2014.11.149 Document Type: Article

Times cited : (18)

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