Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution

Micron

Volumn 68, Issue , 2015, Pages 164-175

  Calderon, H A ^a   Kisielowski, C ^b   Specht, P ^c   Barton, B ^b   Godinez Salomon, F ^d   Solorza Feria, O ^d  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

Atomic resolution; Beam damage; Beam induced transformation; Electron microscopy; Graphene; Low dose microscopy; Nanoparticles

Indexed keywords

EID: 84914177051     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2014.08.007     Document Type: Article

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