Successful application of Low Voltage Electron Microscopy to practical materials problems

Ultramicroscopy

Volumn 145, Issue , 2014, Pages 56-65

  Bell, David C ^a,b   Mankin, Max ^c   Day, Robert W ^c   Erdman, Natasha ^d  

^a HARVARD UNIVERSITY   (United States)

^b HARVARD UNIVERSITY   (United States)

^c HARVARD UNIVERSITY   (United States)

^d JEOL USA Inc Peabody   (United States)

Author keywords

Aberration correction; Carbon black; Graphene; Low voltage; LVEM; LVHREM; Monochromator; Nanowires; Radiation damage; TEM; Zeolite

Indexed keywords

CARBON BLACK; ELASTIC SCATTERING; ELECTRON MICROSCOPES; EXCITONS; GRAPHENE; MONOCHROMATORS; NANOPARTICLES; RADIATION CHEMISTRY; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY; ZEOLITES;

ABERRATION CORRECTION; ACCELERATING VOLTAGES; DELOCALIZATION EFFECTS; HIGH-RESOLUTION MICROSCOPY; LOW VOLTAGES; LOW-VOLTAGE ELECTRON MICROSCOPIES; LVEM; LVHREM;

NANOWIRES;

GRAPHENE; NANOCOATING; NANOMATERIAL; NANOPARTICLE; NANOWIRE; PALLADIUM; SILICON; SILICON DIOXIDE;

ARTICLE; CALIBRATION; CHEMICAL BOND; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IONIZATION; LONG TERM EXPOSURE; LOW VOLTAGE HIGH RESOLUTION ELECTRON MICROSCOPY; POROSITY; RADIOLYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE PROPERTY; THICKNESS;

EID: 84905722423     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.03.005     Document Type: Article

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