Metrics of graininess: Robust quantification of grain count from the non-uniformity of scattering rings

Journal of Applied Crystallography

Volumn 47, Issue 6, 2014, Pages 1855-1865

  Yager, Kevin G ^a   Majewski, Pawel W ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

grain quantification; texture analysis; X ray scattering

Indexed keywords

GRAIN SIZE AND SHAPE;

AVERAGE GRAIN SIZE; CRYSTALLINE FRACTIONS; DIFFRACTION RINGS; FINITE NUMBER; INSTRUMENTAL BROADENING; NONUNIFORMITY; SCALING RELATIONSHIPS; TEXTURE ANALYSIS;

X RAY SCATTERING;

EID: 84914148873     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576714020822     Document Type: Article

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