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Volumn 89, Issue 7, 2006, Pages 2232-2238
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Automatic crystal size determination in the micrometer range from spotty X-ray diffraction rings of powder samples
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Author keywords
[No Author keywords available]
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Indexed keywords
AGGLOMERATION;
CRYSTAL STRUCTURE;
MICROMETERS;
OPTICAL COLLIMATORS;
POLYCRYSTALS;
X RAY DIFFRACTION ANALYSIS;
AREA DETECTOR;
CRYSTAL SIZE;
MICROMETER RANGE;
X-RAY LINE-BROADENING ANALYSES;
MATERIALS SCIENCE;
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EID: 33745346366
PISSN: 00027820
EISSN: 15512916
Source Type: Journal
DOI: 10.1111/j.1551-2916.2006.00998.x Document Type: Article |
Times cited : (21)
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References (13)
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