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Volumn 42, Issue 5, 2015, Pages 2411-2420

Predicting long-term lumen maintenance life of LED light sources using a particle filter-based prognostic approach

Author keywords

LED light sources; Lumen maintenance; Particle filter; Prognostics; Remaining useful life; TM 21 standard

Indexed keywords

BANDPASS FILTERS; FORECASTING; LIGHT EMITTING DIODES; MAINTENANCE; UNCERTAINTY ANALYSIS;

EID: 84912553142     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2014.10.021     Document Type: Article
Times cited : (77)

References (33)
  • 1
    • 84875860422 scopus 로고    scopus 로고
    • Prognostics 101: A tutorial for particle filter-based prognostics algorithm using Matlab
    • D. An, J.H. Choi, and N.H. Kim Prognostics 101: A tutorial for particle filter-based prognostics algorithm using Matlab Reliability Engineering & System Safety 115 2013 161 169
    • (2013) Reliability Engineering & System Safety , vol.115 , pp. 161-169
    • An, D.1    Choi, J.H.2    Kim, N.H.3
  • 5
    • 70449518186 scopus 로고    scopus 로고
    • Machine condition prognosis based on sequential Monte Carlo method
    • W. Caesarendra, G. Niu, and B.S. Yang Machine condition prognosis based on sequential Monte Carlo method Expert Systems with Applications 37 2010 2412 2420
    • (2010) Expert Systems with Applications , vol.37 , pp. 2412-2420
    • Caesarendra, W.1    Niu, G.2    Yang, B.S.3
  • 11
    • 84896479592 scopus 로고    scopus 로고
    • Prognostics of chromaticity state for phosphor-converted white light emitting diodes using an unscented kalman filter approach
    • J.J. Fan, K.C. Yung, and M. Pecht Prognostics of chromaticity state for phosphor-converted white light emitting diodes using an unscented kalman filter approach IEEE Transactions on Device and Materials Reliability 14 2014 564 573
    • (2014) IEEE Transactions on Device and Materials Reliability , vol.14 , pp. 564-573
    • Fan, J.J.1    Yung, K.C.2    Pecht, M.3
  • 12
    • 84887836722 scopus 로고    scopus 로고
    • Prognostics of lumen maintenance for high power white light emitting diodes using a nonlinear filter-based approach
    • J.J. Fan, K.C. Yung, and M. Pecht Prognostics of lumen maintenance for high power white light emitting diodes using a nonlinear filter-based approach Reliability Engineering & System Safety 123 2014 63 72
    • (2014) Reliability Engineering & System Safety , vol.123 , pp. 63-72
    • Fan, J.J.1    Yung, K.C.2    Pecht, M.3
  • 14
    • 82255183153 scopus 로고    scopus 로고
    • Long-term potential performance degradation analysis method based on dynamical probability model
    • C. Hua, G.H. Xu, Q. Zhang, Y.Z. Zhang, J. Xie, and S.Z. Li Long-term potential performance degradation analysis method based on dynamical probability model Expert Systems with Applications 39 2012 4410 4417
    • (2012) Expert Systems with Applications , vol.39 , pp. 4410-4417
    • Hua, C.1    Xu, G.H.2    Zhang, Q.3    Zhang, Y.Z.4    Xie, J.5    Li, S.Z.6
  • 17
    • 84155163010 scopus 로고    scopus 로고
    • Increasing the reliability of solid state lighting systems via self-healing approaches: A review
    • U. Lafont, H. van Zeijl, and S. van der Zwaag Increasing the reliability of solid state lighting systems via self-healing approaches: A review Microelectronics Reliability 52 2012 71 89
    • (2012) Microelectronics Reliability , vol.52 , pp. 71-89
    • Lafont, U.1    Van Zeijl, H.2    Van Der Zwaag, S.3
  • 18
    • 84892589545 scopus 로고    scopus 로고
    • Fight sample degeneracy and impoverishment in particle filters: A review of intelligent approaches
    • T.C. Li, S.D. Sun, T.P. Sattar, and J.M. Corchado Fight sample degeneracy and impoverishment in particle filters: A review of intelligent approaches Expert Systems with Applications 41 2014 3944 3954
    • (2014) Expert Systems with Applications , vol.41 , pp. 3944-3954
    • Li, T.C.1    Sun, S.D.2    Sattar, T.P.3    Corchado, J.M.4
  • 19
    • 0027595086 scopus 로고
    • Using degradation measures to estimate a time-to-failure distribution
    • C.J. Lu, and W.Q. Meeker Using degradation measures to estimate a time-to-failure distribution Technometrics 35 1993 161 174
    • (1993) Technometrics , vol.35 , pp. 161-174
    • Lu, C.J.1    Meeker, W.Q.2
  • 21
    • 84879839833 scopus 로고    scopus 로고
    • Remaining useful life prediction of lithium-ion battery with unscented particle filter technique
    • Q. Miao, L. Xie, H.J. Cui, W. Liang, and M. Pecht Remaining useful life prediction of lithium-ion battery with unscented particle filter technique Microelectronics Reliability 53 2013 805 810
    • (2013) Microelectronics Reliability , vol.53 , pp. 805-810
    • Miao, Q.1    Xie, L.2    Cui, H.J.3    Liang, W.4    Pecht, M.5
  • 24
    • 19744374735 scopus 로고    scopus 로고
    • Solid-state light sources getting smart
    • E.F. Schubert, and J.K. Kim Solid-state light sources getting smart Science 308 2005 1274 1278
    • (2005) Science , vol.308 , pp. 1274-1278
    • Schubert, E.F.1    Kim, J.K.2
  • 25
    • 79955584653 scopus 로고    scopus 로고
    • Remaining useful life estimation - A review on the statistical data driven approaches
    • X.S. Si, W.B. Wang, C.H. Hu, and D.H. Zhou Remaining useful life estimation - A review on the statistical data driven approaches European Journal of Operational Research 213 2011 1 14
    • (2011) European Journal of Operational Research , vol.213 , pp. 1-14
    • Si, X.S.1    Wang, W.B.2    Hu, C.H.3    Zhou, D.H.4
  • 27
    • 84901633322 scopus 로고    scopus 로고
    • Useful lifetime analysis for high-power white LEDs
    • F.K. Wang, and Y.C. Lu Useful lifetime analysis for high-power white LEDs Microelectronics Reliability 54 2014 1307 1315
    • (2014) Microelectronics Reliability , vol.54 , pp. 1307-1315
    • Wang, F.K.1    Lu, Y.C.2
  • 29
    • 84879837145 scopus 로고    scopus 로고
    • An ensemble model for predicting the remaining useful performance of lithium-ion batteries
    • Y.J. Xing, E.W.M. Ma, K.L. Tsui, and M. Pecht An ensemble model for predicting the remaining useful performance of lithium-ion batteries Microelectronics Reliability 53 2013 811 820
    • (2013) Microelectronics Reliability , vol.53 , pp. 811-820
    • Xing, Y.J.1    Ma, E.W.M.2    Tsui, K.L.3    Pecht, M.4
  • 30
    • 84903130054 scopus 로고    scopus 로고
    • Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model
    • J.P. Zhang, W.B. Li, G.L. Cheng, X. Chen, H. Wu, and M.H.H. Shen Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model Journal of Luminescence 154 2014 491 495
    • (2014) Journal of Luminescence , vol.154 , pp. 491-495
    • Zhang, J.P.1    Li, W.B.2    Cheng, G.L.3    Chen, X.4    Wu, H.5    Shen, M.H.H.6
  • 31
    • 84863319114 scopus 로고    scopus 로고
    • Life prediction for white OLED based on LSM under lognormal distribution
    • J.P. Zhang, F. Liu, Y. Liu, H.L. Wu, W.Q. Zhu, and W.L. Wu Life prediction for white OLED based on LSM under lognormal distribution Solid-State Electronics 75 2012 102 106
    • (2012) Solid-State Electronics , vol.75 , pp. 102-106
    • Zhang, J.P.1    Liu, F.2    Liu, Y.3    Wu, H.L.4    Zhu, W.Q.5    Wu, W.L.6
  • 32
    • 77957827887 scopus 로고    scopus 로고
    • Particle filter based on particle swarm optimization resampling for vision tracking
    • J. Zhao, and Z.Y. Li Particle filter based on particle swarm optimization resampling for vision tracking Expert Systems with Applications 37 2010 8910 8914
    • (2010) Expert Systems with Applications , vol.37 , pp. 8910-8914
    • Zhao, J.1    Li, Z.Y.2
  • 33
    • 78650831915 scopus 로고    scopus 로고
    • Particle filtering prognostic estimation of the remaining useful life of nonlinear components
    • E. Zio, and G. Peloni Particle filtering prognostic estimation of the remaining useful life of nonlinear components Reliability Engineering & System Safety 96 2011 403 409
    • (2011) Reliability Engineering & System Safety , vol.96 , pp. 403-409
    • Zio, E.1    Peloni, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.