An approach to "design for Reliability" in solid state lighting systems at high temperatures

Microelectronics Reliability

Volumn 52, Issue 5, 2012, Pages 783-793

  Tarashioon, S ^a,b   Baiano, A ^b   Van Zeijl, H ^b   Guo, C ^a   Koh, S W ^b   Van Driel, W D ^b   Zhang, G Q ^b  

^a MATERIALS INNOVATION INSTITUTE M2I   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIONAL FLEXIBILITIES; CRITICAL FAILURES; DESIGN FOR RELIABILITY; DESIGN IMPROVEMENTS; DESIGN PHASE; HIGH TEMPERATURE; JUNCTION TEMPERATURES; LIGHTING TECHNOLOGY; MAINTENANCE SYSTEMS; PHYSICS OF FAILURES; PROCESSING CAPABILITY; PRODUCT IMPROVEMENT; RELIABILITY APPROACH; RELIABILITY INFORMATION; SELF-MAINTENANCE; SOLID STATE LIGHTING; SOLID STATE LIGHTING SYSTEMS; SYSTEMATIC METHOD;

DATA HANDLING; DESIGN; LIGHTING; MAINTENANCE; SENSORS;

RELIABILITY;

EID: 84860387303     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.06.029     Document Type: Article

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