SCOPUS 정보 검색 플랫폼

Journal of Luminescence

Volumn 154, Issue , 2014, Pages 491-495

Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model

(6) Zhang, Jianping a Li, Wenbin a Cheng, Guoliang b Chen, Xiao b Wu, Helen c Herman Shen, M H d

a SHANGHAI UNIVERSITY OF ELECTRIC POWER (China)

b Shanghai Tianyi Electric CO LTD (China)

c UNIVERSITY OF WESTERN SYDNEY (Australia)

d The Ohio State University (United States)

Author keywords

Accelerated degradation tests; Life prediction; Luminance decaying model; OLED; Weibull function

Indexed keywords

DECAY (ORGANIC); FORECASTING; LEAST SQUARES APPROXIMATIONS; ORGANIC LIGHT EMITTING DIODES (OLED); WEIBULL DISTRIBUTION;

ACCELERATED DEGRADATION TESTS; LEAST SQUARE METHODS; LIFE PREDICTIONS; MANUFACTURING STRATEGY; NUMERICAL RESULTS; OLED; PERFORMANCE DEGRADATION; WEIBULL FUNCTIONS;

LUMINANCE;

EID: 84903130054 PISSN: 00222313 EISSN: None Source Type: Journal
DOI: 10.1016/j.jlumin.2014.05.024 Document Type: Article

Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.