Useful lifetime analysis for high-power white LEDs

Microelectronics Reliability

Volumn 54, Issue 6-7, 2014, Pages 1307-1315

  Wang, Fu Kwun ^a   Lu, Yi Chen ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Accelerated degradation test; Bi exponential model; Degradation data driven method; HPWLED; Useful lifetime

Indexed keywords

LEAST SQUARES APPROXIMATIONS; LIGHT EMITTING DIODES;

ACCELERATED DEGRADATION TESTS; BI-EXPONENTIAL MODELS; DEGRADATION-DATA-DRIVEN METHOD; HPWLED; USEFUL LIFETIME;

EXTRAPOLATION;

EID: 84901633322     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2014.02.029     Document Type: Article

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