Life prediction for white OLED based on LSM under lognormal distribution

Solid-State Electronics

Volumn 75, Issue , 2012, Pages 102-106

  Zhang, Jianping ^a   Liu, Fang ^a   Liu, Yu ^b,c   Wu, Helen ^c   Zhu, Wenqing ^d   Wu, Wenli ^a   Wu, Liang ^a  

^a SHANGHAI UNIVERSITY OF ELECTRIC POWER   (China)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

^c UNIVERSITY OF WESTERN SYDNEY   (Australia)

^d SHANGHAI UNIVERSITY   (China)

Author keywords

Accelerated life test; Life prediction; Lognormal distribution; LSM; White OLED

Indexed keywords

ACCELERATED LIFE TESTS; LIFE PREDICTIONS; LOG-NORMAL DISTRIBUTION; LSM; WHITE OLED;

LEAST SQUARES APPROXIMATIONS; TESTING;

LIGHT EMITTING DIODES;

EID: 84863319114     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2011.12.004     Document Type: Article

References (19)

1. Boquan Wan, and Jing Xie Resent progress in organic light-emitting diode Electron Eng Product World 2007 56 64 [in Chinese]
2. C.W. Tang, and S.A. VanSlyke Organic electroluminescent diodes Appl Phys Lett 51 12 1987 913 915
3. Qingyi Liu, and Zhifeng Zhang Research and development of OLED Vac Electron 5 2005 24 27 [in Chinese]
4. Tianhai Chang, and Shuangqing Peng The progress of application technology about the OLED Vac Cryogenics 4 2 2008 115 118 [in Chinese]
5. Disha Feng, and Bin Wu Display technology overview of OLED Fujian Computer 5 2006 28 30 [in Chinese]
6. Wei Xu Life is the largest technical difficulty of OLED currently China Electron News 2008 [in Chinese]
7. Deqiang Zhang The opportunities and the challenges of the OLED technology and industry New Chem Mater 38 8 2010 1 3 [in Chinese]
8. Shuying Ni, Youzhi Wu, and Runguang Sun Automatic measurement system for organic light emitting diodes (OLEDs) J Shanghai University (Nat Sci Edition) 10 4 2004 337 340 [348, in Chinese]
9. Qiang Peng, and Ruohe Yao Design and implementation of novel OLED test system Semicond Technol 34 5 2009 467 469 [in Chinese]
10. Sakariya Kapil, KMNg Clement, and Servati Peyman Accelerated stress testing of a-Si: H pixel circuits for AMOLED displays IEEE Trans Electron Dev 52 12 2005 2577 2583
11. Wen Luo, Jianzhong Wei, and Hui Yang Electronic components reliability test engineering 2005 Publishing House of Electronics Industry [in Chinese]
12. Shisong Mao, and Lingling Wang Accelerated life test 1997 Science Publishing Company Beijing [in Chinese]
13. Lei Zhang, Liangyong Yang, and Guoqiang Lv A kind of display drive interface circuit for OLED microdisplays Chinese J Liq Cryst Displays 21 6 2006 726 731 [in Chinese]
14. Lin Lin, Guohua Zhuang, and Shanshan Huang Lifetime estimation of high-power white LEDs J Fuqing Branch Fujian Normal University 96 2009 103 105 [in Chinese]
15. Xiaoying Cui GaAs devices life test and methods comparing Electron Product Reliab Environ Test B10 2009 80 85 [in Chinese]
16. Aling Zhao, Shoujin Shang, and Jianxin Chen Life test and failure mechanism analyses for high-power white LED China Illum Eng J 21 1 2010 48 52 [57, in Chinese]
17. W. Nelson Accelerated life testing-step-stress models and data analyses IEEE Trans Reliab R-29 1980 103 108
18. D.R. Barr, and T. Davidson A Kolmogorov-Smirnov test for censored samples Technol Metrics 15 4 1973 739 757
19. Jianping Zhang, and Ruitao Wang Reliability life prediction of VFD by Constant temperature stress accelerated life tests and maximum likelihood estimation J Test Eval 37 4 2009 316 320