Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Barnard, Edward S ^a,b   Hoke, Eric T ^b   Connor, Stephen T ^b   Groves, James R ^b   Kuykendall, Tevye ^a   Yan, Zewu ^a   Samulon, Eric C ^a   Bourret Courchesne, Edith D ^a   Aloni, Shaul ^a   James Schuck, P ^a   Peters, Craig H ^b   Hardin, Brian E ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b PLANT PV Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84906781540     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02098     Document Type: Article

References (31)

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