Comparison of minority carrier lifetime measurements in superstrate and substrate CdTe PV devices

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 001271-001274

  Gessert, T A ^a   Dhere, R G ^a   Duenow, J N ^a   Kuciauskas, D ^a   Kanevce, A ^a   Bergeson, J D ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE PROCEDURES; CDS/CDTE; CDTE; CDTE DEVICES; DEPLETION REGION; DEVICE FUNCTIONALITY; DEVICE PERFORMANCE; DEVICE PROCESSING; INTERFACE RECOMBINATION; MINORITY CARRIER LIFETIMES; NUMERICAL MODELING; PERFORMANCE PARAMETERS; PHOTOVOLTAIC; RECOMBINATION RATE; SUPERSTRATES; TIME-RESOLVED PHOTOLUMINESCENCE;

PHOTOVOLTAIC EFFECTS;

CADMIUM TELLURIDE;

EID: 84861038572     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186189     Document Type: Conference Paper

References (8)

1. th WCPVEC, 2006, pp. 432-435.
2. T.A. Gessert, et al., Thin Solid Films, 517, 200, pp. 2370-2373.
3. D.S. Albin, R.G. Dhere, S.C. Glynn, J. Del Cueto, and W.K. Metzger, "Degradation and Capacitance-Voltage Hysteresis in CdTe Devices," Proc. 2009 SPIE Optics+Photonics Meeting, NREL/CP-520-46304 (2009).
4. W.K. Metzger, D. Albin, D. Levi, P. Sheldon, X. Li, B.M. Keyes, and R.K. Ahrenkiel, J. Appl. Phys., 94 (6) (2003).
5. T.A. Gessert, R.G. Dhere, J.N. Duenow, J.V. Li, S.E. Asher, and M.R. Young, "Comparison of CdS/CdTe Superstrate and Substrate Devices Fabricated with a ZnTe:Zu Contact Interface, Proc. 35 IEEE Photovoltaics Specialists Conf., Honolulu, Hawaii, (2010).
6. "Synopsys, TCAD SDEVICE Manual, Release A-2008.09, Zurich, Switzerland, www.synopsys.com.
7. A. Kanevce and T.A. Gessert, "Optimiizing CdTe Solar Cell Performance; Impact of Variations in Minority Carrier Lifetime and Carrier Density Profile," This Conference.
8. A. Kanevce, D. Kuciauskas, J. Appl. Physics, To be published (2011).