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Volumn 54, Issue 6, 2000, Pages 773-782

Modeling and measuring the effect of refraction on the depth resolution of confocal Raman microscopy

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; INTERFACES (MATERIALS); LASER APPLICATIONS; MATHEMATICAL MODELS; POLYMERS; RAY TRACING; REFRACTION; REFRACTIVE INDEX; SUBSTRATES;

EID: 0034206888     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702001950382     Document Type: Article
Times cited : (320)

References (18)
  • 1
    • 0001536323 scopus 로고
    • Raman Microprobe Spectroscopy
    • R. Clark and R. Hester, Eds. Heydon, London, Chap. 4
    • G. Rosasco, "Raman Microprobe Spectroscopy", in Advances in IR and Raman Spectroscopy, R. Clark and R. Hester, Eds. (Heydon, London, 1980), Vol. 7, Chap. 4, pp. 223-283.
    • (1980) Advances in IR and Raman Spectroscopy , vol.7 , pp. 223-283
    • Rosasco, G.1
  • 10
    • 0002661659 scopus 로고    scopus 로고
    • Raman Spectroscopy of Synthetic Polymers
    • M. J. Pelletier, Ed. Blackwell Science, Oxford
    • N. Everall, "Raman Spectroscopy of Synthetic Polymers", in Analytical Applications of Raman Spectroscopy, M. J. Pelletier, Ed. (Blackwell Science, Oxford, 1999), pp. 127-192.
    • (1999) Analytical Applications of Raman Spectroscopy , pp. 127-192
    • Everall, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.