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Volumn 54, Issue 6, 2000, Pages 773-782
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Modeling and measuring the effect of refraction on the depth resolution of confocal Raman microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
FOCUSING;
INTERFACES (MATERIALS);
LASER APPLICATIONS;
MATHEMATICAL MODELS;
POLYMERS;
RAY TRACING;
REFRACTION;
REFRACTIVE INDEX;
SUBSTRATES;
CONFOCAL RAMAN MICROSCOPY;
DEPTH PROFILING;
LASER BEAM INTENSITY DISTRIBUTION;
NUMERICAL APERTURE;
MICROSCOPIC EXAMINATION;
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EID: 0034206888
PISSN: 00037028
EISSN: None
Source Type: Journal
DOI: 10.1366/0003702001950382 Document Type: Article |
Times cited : (320)
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References (18)
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