Bias temperature instability variation on SiON/Poly, HK/MG and trigate architectures

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2014, Pages

  Prasad, C ^a   Agostinelli, M ^a   Hicks, J ^a   Ramey, S ^a   Auth, C ^a   Mistry, K ^a   Natarajan, S ^a   Packan, P ^a   Post, I ^a   Bodapati, S ^a   Giles, M ^a   Gupta, S ^a   Mudanai, S ^a   Kuhn, K ^a  

^a INTEL CORPORATION   (United States)

Author keywords

BTI; HK MG; reliability; SiON Poly; Tri gate; variation

Indexed keywords

RELIABILITY;

BTI; HK/MG; SION/POLY; TRIGATE; VARIATION;

INTEGRATED CIRCUITS;

EID: 84905665875     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2014.6861101     Document Type: Conference Paper

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