Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2012, Pages

  Miki, H ^a   Tega, N ^a   Yamaoka, M ^a   Frank, D J ^b   Bansal, A ^b   Kobayashi, M ^b   Cheng, K ^b   D'Emic, C P ^b   Ren, Z ^b   Wu, S ^c   Yau, J B ^b   Zhu, Y ^b   Guillorn, M A ^b   Park, D G ^b   Haensch, W ^b   Leobandung, E ^a   Torii, K ^a  

^a HITACHI LTD   (Japan)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c IBM JAPAN LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HYSTERETIC BEHAVIOR; LOGIC DELAYS; OPERATIONAL STABILITY; RANDOM TELEGRAPH NOISE; ROBUST ALGORITHM; TIME CONSTANTS; TIME-SCALES; UNDOPED CHANNELS;

ELECTRON DEVICES; INTEGRATED CIRCUITS;

MOSFET DEVICES;

EID: 84876100025     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2012.6479071     Document Type: Conference Paper

References (7)

1. K. Takeuchi, IEICE Trans. Electron., vol. E95-C, no. 4, p. 414, 2012.
2. N. Tega, H. Miki, Z. Ren, C. P. D'Emic, Y. Zhu, D. J. Frank, J. Cai, M. A. Guillorn, D.-G. Park, W. Haensch, and K. Torii, in International Electron Devices Meeting (IEDM)), 2009, p. 771.
3. D. J. Frank, in International Reliability Physics Symposium (IRPS), 2012, (tutorial).
4. H. Miki, M. Yamaoka, N. Tega, Z. Ren, M. Kobayashi, C. P. D'Emic, Y. Zhu, D. J. Frank, M. A. Guillorn, D.-G. Park, W. Haensch, and K. Torii, in Symposium on VLSI Technology (VLSIT)), 2011, p. 148.
5. H. Miki, N. Tega, Z. Ren, C. P. D'Emic, Y. Zhu, D. J. Frank, M. A. Guillorn, D.-G. Park, W. Haensch, and K. Torii, in International Electron Devices Meeting (IEDM)), 2010, p. 620.
6. H. Miki, M. Yamaoka, D. J. Frank, K. Cheng, D.-G. Park, E. Leobandung, and K. Torii, in Symposium on VLSI Technology (VLSIT)), 2012, p. 137.
7. M. Yamaoka, H. Miki, A. Bansal, S. Wu, D. J. Frank, E. Leobandung, and K. Torii, in International Electron Devices Meeting (IEDM)), 2011, p. 745.