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Volumn 4, Issue 60, 2014, Pages 31729-31734

Tunable field emission properties of well-aligned silicon nanowires with controlled aspect ratio and proximity

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ELECTRIC FIELDS; FIELD EMISSION; SILICON; SURFACE ROUGHNESS;

EID: 84905493006     PISSN: None     EISSN: 20462069     Source Type: Journal    
DOI: 10.1039/c4ra04440a     Document Type: Article
Times cited : (13)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.