ZnO nanoneedles with tip surface perturbations: Excellent field emitters

Applied Physics Letters

Volumn 84, Issue 18, 2004, Pages 3603-3605

  Li, Y B ^a   Bando, Y ^a   Golberg, D ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CHEMICAL VAPOR DEPOSITION; CURRENT DENSITY; ELECTRIC FIELD EFFECTS; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

FIELD-EMISSION PROPERTIES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANONEEDLES; THRESHOLD FIELDS;

NANOSTRUCTURED MATERIALS;

EID: 2542441637     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1738174     Document Type: Article

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