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Volumn 100, Issue , 2014, Pages 39-44

Incremental resistance programming of programmable metallization cells for use as electronic synapses

Author keywords

Chalcogenide; PMC; ReRAM; Resistive memory; Synapse

Indexed keywords

CHALCOGENIDES; COMPUTER PROGRAMMING; GERMANIUM; HARDWARE; SWITCHING;

EID: 84905010314     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2014.07.002     Document Type: Article
Times cited : (35)

References (21)
  • 1
    • 20444372632 scopus 로고    scopus 로고
    • Nanoscale memory elements based on solid-state electrolytes
    • DOI 10.1109/TNANO.2005.846936, 2004 Silicon Nanoelectronics Workshop
    • M.N. Kozicki, M. Park, and M. Mitkova Nanoscale memory elements based on solid state electrolytes IEEE Trans Nanotechnol 4 3 2005 331 338 (Pubitemid 40794460)
    • (2005) IEEE Transactions on Nanotechnology , vol.4 , Issue.3 , pp. 331-338
    • Kozicki, M.N.1    Park, M.2    Mitkova, M.3
  • 2
    • 84873649755 scopus 로고    scopus 로고
    • Cation-based resistance change memory
    • I. Valov, and M.N. Kozicki Cation-based resistance change memory J Phys D: Appl Phys 46 2013 074005
    • (2013) J Phys D: Appl Phys , vol.46 , pp. 074005
    • Valov, I.1    Kozicki, M.N.2
  • 3
    • 35748974883 scopus 로고    scopus 로고
    • Nanoionics-based resistive switching memories
    • DOI 10.1038/nmat2023, PII NMAT2023
    • R. Waser, and M. Aono Nano ionics-based resistive switching memories Nat Mater 6 2007 833 840 (Pubitemid 350064191)
    • (2007) Nature Materials , vol.6 , Issue.11 , pp. 833-840
    • Waser, R.1    Aono, M.2
  • 5
    • 79952282675 scopus 로고    scopus 로고
    • Demonstration of conductive bridging random access memory (CBRAM) in logic CMOS process
    • C. Gopalan, Y. Ma, T. Gallo, J. Wang, E. Runnion, and J. Saenz et al. Demonstration of conductive bridging random access memory (CBRAM) in logic CMOS process Solid-State Electron 58 2011 54 61
    • (2011) Solid-State Electron , vol.58 , pp. 54-61
    • Gopalan, C.1    Ma, Y.2    Gallo, T.3    Wang, J.4    Runnion, E.5    Saenz, J.6
  • 7
    • 79956097494 scopus 로고    scopus 로고
    • Low voltage cycling of programmable metallization cell memory devices
    • D. Kamalanathan, A. Akhavan, and M.N. Kozicki Low voltage cycling of programmable metallization cell memory devices Nanotechnology 22 2011 254017
    • (2011) Nanotechnology , vol.22 , pp. 254017
    • Kamalanathan, D.1    Akhavan, A.2    Kozicki, M.N.3
  • 10
    • 0028387050 scopus 로고
    • The basic ideas in neural networks
    • D.E. Rumelhart, B. Widrow, and M.A. Lehr The basic ideas in neural networks Commun ACM 37 3 1994 87 92
    • (1994) Commun ACM , vol.37 , Issue.3 , pp. 87-92
    • Rumelhart, D.E.1    Widrow, B.2    Lehr, M.A.3
  • 11
    • 84864117860 scopus 로고    scopus 로고
    • Temporally asymmetric hebbian learning, spike timing and neuronal response variability
    • L.F. Abbott, and S. Song Temporally asymmetric hebbian learning, spike timing and neuronal response variability Neuron 32 2001 339 350
    • (2001) Neuron , vol.32 , pp. 339-350
    • Abbott, L.F.1    Song, S.2
  • 13
    • 84864114947 scopus 로고    scopus 로고
    • AlOx-based resistive switching device with gradual resistance modulation for neuromorphic device application, memory workshop (IMW)
    • Wu. Yi et al. AlOx-based resistive switching device with gradual resistance modulation for neuromorphic device application, memory workshop (IMW) IEEE Int 1 4 2012 20 23
    • (2012) IEEE Int , vol.1 , Issue.4 , pp. 20-23
    • Yi, Wu.1
  • 15
    • 84885595461 scopus 로고    scopus 로고
    • Ultrafast synaptic events in a chalcogenide memristor
    • Article number: 1619; April
    • Yi Li, Yingpeng Zhong, Lei Xu, Jinjian Zhang, Xiaohua Xu, Huajun Sun, Xiangshui Miao. Ultrafast synaptic events in a chalcogenide memristor. Scientific Reports 3, Article number: 1619; April 2013.
    • (2013) Scientific Reports 3
    • Li, Y.1    Zhong, Y.2    Xu, L.3    Zhang, J.4    Xu, X.5    Sun, H.6    Miao, X.7
  • 16
    • 51949112980 scopus 로고    scopus 로고
    • Spike-timing-dependent learning in memristive nanodevices
    • G.S. Snider Spike-timing-dependent learning in memristive nanodevices IEEE/ACM Int Symp Nanoscale Architec 85-92 2008
    • (2008) IEEE/ACM Int Symp Nanoscale Architec , vol.85-92
    • Snider, G.S.1
  • 17
    • 77950500742 scopus 로고    scopus 로고
    • Memristance can explain spike time-dependent-plasticity in neural synapses
    • B. Linares-Barranco, and T. Serrano-Gotarredona Memristance can explain spike time-dependent-plasticity in neural synapses Nat Proc 2009
    • (2009) Nat Proc
    • Linares-Barranco, B.1    Serrano-Gotarredona, T.2
  • 19
    • 0036006168 scopus 로고    scopus 로고
    • Synaptic modification in neural circuits: A timely action
    • DOI 10.1002/bies.10060
    • B. Berninger, and G.Q. Bi Synaptic modification in neural circuits: a timely action BioEssays 24 2002 212 222 (Pubitemid 34248687)
    • (2002) BioEssays , vol.24 , Issue.3 , pp. 212-222
    • Berninger, B.1    Bi, G.-Q.2
  • 20
    • 79951816422 scopus 로고    scopus 로고
    • Modeling the switching dynamics of programmable-metallization-cell (PMC) memory and its application as synapse device for a neuromorphic computation system
    • 22.1.1 22.1.4
    • S. Yu, and H.-S.P. Wong Modeling the switching dynamics of programmable-metallization-cell (PMC) memory and its application as synapse device for a neuromorphic computation system IEEE Int Electron Dev Meet (IEDM) 22.1.1 22.1.4 2010 6 8
    • (2010) IEEE Int Electron Dev Meet (IEDM) , pp. 6-8
    • Yu, S.1    Wong, H.-S.P.2
  • 21
    • 84876153660 scopus 로고    scopus 로고
    • A neuromorphic visual system using RRAM synaptic devices with Sub-pJ energy and tolerance to variability: Experimental characterization and large-scale modeling
    • 10.4.1 10.4.4
    • S. Yu, B. Gao, Z. Fang, H. Yu, J. Kang, and H.-S.P. Wong A neuromorphic visual system using RRAM synaptic devices with Sub-pJ energy and tolerance to variability: experimental characterization and large-scale modeling Electron Dev Meet (IEDM) IEEE Int 10.4.1 10.4.4 2012 10 13
    • (2012) Electron Dev Meet (IEDM) IEEE Int , pp. 10-13
    • Yu, S.1    Gao, B.2    Fang, Z.3    Yu, H.4    Kang, J.5    Wong, H.-S.P.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.