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Volumn 22, Issue 25, 2011, Pages

Low voltage cycling of programmable metallization cell memory devices

Author keywords

[No Author keywords available]

Indexed keywords

AT POWER SUPPLIES; LOW VOLTAGES; MEMORY TECHNOLOGY; NANO SCALE; NUMBER OF CYCLES; PROGRAM AND ERASE; PROGRAMMABLE METALLIZATION CELLS; RESISTANCE RATIO; RESISTANCE VALUES; SERIES RESISTANCES; SWITCHING SPEED;

EID: 79956097494     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/25/254017     Document Type: Article
Times cited : (14)

References (11)
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    • Nanoscale memory elements based on solid-state electrolytes
    • DOI 10.1109/TNANO.2005.846936, 2004 Silicon Nanoelectronics Workshop
    • Kozicki M N et al 2005 Nanoscale memory elements based on solid-state electrolytes IEEE Trans. Nanotechnol. 4 331-8 (Pubitemid 40794460)
    • (2005) IEEE Transactions on Nanotechnology , vol.4 , Issue.3 , pp. 331-338
    • Kozicki, M.N.1    Park, M.2    Mitkova, M.3
  • 2
    • 28144433129 scopus 로고    scopus 로고
    • A macro model of programmable metallization cell devices
    • DOI 10.1016/j.sse.2005.10.019, PII S0038110105002741
    • Gilbert N E et al 2005 A macro model of programmable metallization cell devices Solid-State Electron. 49 1813-9 (Pubitemid 41693697)
    • (2005) Solid-State Electronics , vol.49 , Issue.11 SPEC. ISS. , pp. 1813-1819
    • Gilbert, N.E.1    Gopalan, C.2    Kozicki, M.N.3
  • 6
    • 75649099362 scopus 로고    scopus 로고
    • Power and energy perspectives of nonvolatile memory technologies
    • Derhacobian N et al 2010 Power and energy perspectives of nonvolatile memory technologies Proc. IEEE 98 283-98
    • (2010) Proc. IEEE , vol.98 , Issue.2 , pp. 283-298
    • Derhacobian, N.1
  • 7
    • 67349281548 scopus 로고    scopus 로고
    • Study of multilevel programming in programmable metallization cell (PMC) memory
    • Russo U et al 2009 Study of multilevel programming in programmable metallization cell (PMC) memory IEEE Trans. Electron Devices 56 1040-7
    • (2009) IEEE Trans. Electron Devices , vol.56 , Issue.5 , pp. 1040-1047
    • Russo, U.1
  • 8
    • 67349169782 scopus 로고    scopus 로고
    • Voltage-driven on-off transition and tradeoff with program and erase current in programmable metallization cell (PMC) memory
    • Kamalanathan D et al 2009 Voltage-driven on-off transition and tradeoff with program and erase current in programmable metallization cell (PMC) memory IEEE Electron Device Lett. 30 553-5
    • (2009) IEEE Electron Device Lett. , vol.30 , Issue.5 , pp. 553-555
    • Kamalanathan, D.1
  • 10
    • 21644443999 scopus 로고    scopus 로고
    • Electrical characterization of solid state ionic memory elements
    • Symanczyk R et al 2003 Electrical characterization of solid state ionic memory elements Proc. Non-Volatile Memory Technology Symp. pp1-6
    • (2003) Proc. Non-Volatile Memory Technology Symp. , pp. 1-6
    • Symanczyk, R.1
  • 11
    • 79956072531 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors (ITRS) available
    • International Technology Roadmap for Semiconductors (ITRS) available: http://www.itrs.net/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.