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Journal of Alloys and Compounds

Volumn 615, Issue , 2014, Pages 355-362

Effect of thickness on the structural and optical properties of sputtered ZnO and ZnO:Mn thin films

(2) Rajalakshmi, R a Angappane, S a

a CENTRE FOR NANO AND SOFT MATTER SCIENCES (India)

Author keywords

Manganese doped zinc oxide; RF magnetron sputtering; Thickness dependence; Zinc oxide

Indexed keywords

MAGNETRON SPUTTERING; MANGANESE; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

BAND-EDGE EMISSIONS; CHARACTERIZATION TECHNIQUES; MANGANESE-DOPED ZINC OXIDES; PREFERENTIAL GROWTH; RF-MAGNETRON SPUTTERING; STRUCTURAL AND OPTICAL PROPERTIES; THICKNESS DEPENDENCE; X-RAY DIFFRACTION MEASUREMENTS;

ZINC OXIDE;

EID: 84904905187 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2014.06.166 Document Type: Article

Times cited : (27)

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