Methods for determining piezoelectric properties of thin epitaxial films: Theoretical foundations

Journal of Applied Physics

Volumn 116, Issue 1, 2014, Pages

  McCartney, L N ^a   Wright, L ^a   Cain, M G ^a   Crain, J ^a,b   Martyna, G J ^c   Newns, D M ^c  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF EDINBURGH   (United Kingdom)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC CONSTANTS; LATTICE MISMATCH; THERMAL EXPANSION; THIN FILMS;

ANALYTICAL METHOD; CURVATURE MEASUREMENT; DIFFERENTIAL THERMAL EXPANSION; EXPERIMENTAL CONDITIONS; IN-PLANE DEFORMATION; PIEZOELECTRIC PROPERTY; THEORETICAL FOUNDATIONS; THIN EPITAXIAL FILMS;

PIEZOELECTRICITY;

EID: 84904133526     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4885058     Document Type: Article

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