Challenges for the determination of piezoelectric constants with piezoresponse force microscopy

Applied Physics Letters

Volumn 91, Issue 25, 2007, Pages

  Jungk, Tobias ^a   Hoffmann, Ákos ^a   Soergel, Elisabeth ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PIEZOELECTRICITY;

MACROSCOPIC MEASUREMENTS; PIEZOELECTRIC COEFFICIENTS; PIEZORESPONSE FORCE MICROSCOPY (PFM);

IMAGE PROCESSING;

EID: 37549004728     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2827566     Document Type: Article

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