A double-beam common path laser interferometer for the measurement of electric field-induced strains of piezoelectric thin films

Review of Scientific Instruments

Volumn 76, Issue 12, 2005, Pages 1-4

  Huang, Z ^a   Whatmore, R W ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; INTERFEROMETERS; PIEZOELECTRIC DEVICES; THIN FILMS;

DOUBLE-BEAM TECHNIQUE; LASER INTERFEROMETER; LASER SCANNING; LASER VIBROMETERS;

LASER OPTICS;

EID: 29744462585     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2149002     Document Type: Article

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