SCOPUS 정보 검색 플랫폼

Volumn 103, Issue 13, 2013, Pages

Electrode size dependence of piezoelectric response of lead zirconate titanate thin films measured by double beam laser interferometry

(6) Sivaramakrishnan, S a Mardilovich, P a,e Mason, A b Roelofs, A c Schmitz Kempen, T d Tiedke, S d

a HEWLETT PACKARD COMPANY (United States)

b Oregon State University (United States)

c ARGONNE NATIONAL LABORATORY (United States)

d AIXACCT SYSTEMS GMBH (Germany)

e Xaar Technology Ltd (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LASER INTERFEROMETER MEASUREMENTS; LEAD ZIRCONATE TITANATE THIN FILMS; MEASURED VALUES; PIEZOELECTRIC RESPONSE; RIGID SUBSTRATES; SILICON SUBSTRATES; SUBSTRATE THICKNESS; THEORETICAL VALUES;

LASER INTERFEROMETRY; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; THIN FILMS;

SUBSTRATES;

EID: 84884997676 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4821948 Document Type: Article

Times cited : (49)

References (7)

1
- 5244280905
- 10.1063/1.1147000
- A. L. Kholkin, Ch. Wütchrich, D. V. Taylor, and N. Setter, Rev. Sci. Instrum. 67, 1935 (1996). 10.1063/1.1147000
- (1996) Rev. Sci. Instrum. , vol.67 , pp. 1935
- Kholkin, A.L.¹ Wütchrich, Ch.² Taylor, D.V.³ Setter, N.⁴

2
- 0001091881
- 10.1063/1.126610
- T. Haccart, E. Cattan, D. Remiens, S. Hiboux, and P. Muralt, Appl. Phys. Lett. 76, 3292 (2000). 10.1063/1.126610
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3292
- Haccart, T.¹ Cattan, E.² Remiens, D.³ Hiboux, S.⁴ Muralt, P.⁵

3
- 0038341784
- 10.1063/1.1544415
- P. Gerber, A. Roelofs, O. Lohse, C. Kügeler, S. Tiedke, U. Böttger, and R. Waser, Rev. Sci. Instrum. 74, 2613 (2003). 10.1063/1.1544415
- (2003) Rev. Sci. Instrum. , vol.74 , pp. 2613
- Gerber, P.¹ Roelofs, A.² Lohse, O.³ Kügeler, C.⁴ Tiedke, S.⁵ Böttger, U.⁶ Waser, R.⁷

4
- 19944397715
- 10.1063/1.357693
- K. Lefki and G. J. M. Dormans, J. Appl. Phys. 76, 1764 (1994). 10.1063/1.357693
- (1994) J. Appl. Phys. , vol.76 , pp. 1764
- Lefki, K.¹ Dormans, G.J.M.²

5
- 63849298913
- 10.1177/1045389X08096164
- N. Zalachas, B. Laskewitz, M. Kamlah, K. Prume, Y. Lapusta, and S. Tiedke, J. Intell. Mater. Syst. Struct. 20, 683 (2009). 10.1177/1045389X08096164
- (2009) J. Intell. Mater. Syst. Struct. , vol.20 , pp. 683
- Zalachas, N.¹ Laskewitz, B.² Kamlah, M.³ Prume, K.⁴ Lapusta, Y.⁵ Tiedke, S.⁶

6
- 4944235380
- 10.1063/1.1775306
- P. Gerber, A. Roelofs, C. Kügeler, U. Böttger, R. Waser, and K. Prume, J. Appl. Phys. 96, 2800 (2004). 10.1063/1.1775306
- (2004) J. Appl. Phys. , vol.96 , pp. 2800
- Gerber, P.¹ Roelofs, A.² Kügeler, C.³ Böttger, U.⁴ Waser, R.⁵ Prume, K.⁶

7
- 28144440507
- 10.1109/ISAF.2004.1418325
- K. Prume, P. Gerber, C. Kügeler, A. Roelofs, U. Böttger, R. Waser, T. Schmitz-Kempen, and S. Tiedke, in 14th IEEE International Symposium on Applications of Ferroelectrics-ISAF-04 (2004), Vol. 1, p. 7. 10.1109/ISAF.2004.1418325
- (2004) 14th IEEE International Symposium on Applications of Ferroelectrics - ISAF-04 , vol.1 , pp. 7
- Prume, K.¹ Gerber, P.² Kügeler, C.³ Roelofs, A.⁴ Böttger, U.⁵ Waser, R.⁶ Schmitz-Kempen, T.⁷ Tiedke, S.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.