High thermal robustness of molecularly thin perovskite nanosheets and implications for superior dielectric properties

ACS Nano

Volumn 8, Issue 6, 2014, Pages 5449-5461

  Li, Bao Wen ^a   Osada, Minoru ^a,b   Ebina, Yasuo ^a,b   Akatsuka, Kosho ^a,b   Fukuda, Katsutoshi ^a,b   Sasaki, Takayoshi ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

layer by layer assembly; nanodielectrics; perovskite type nanosheets; thermal stability

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCIUM; DIELECTRIC PROPERTIES; OXIDE FILMS; PEROVSKITE; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH THERMAL STABILITY; LAYER-BY-LAYER ASSEMBLIES; NANODIELECTRICS; PEROVSKITE TYPE; PEROVSKITE-TYPE NIOBATE; PHASE TRANSFORMATION TEMPERATURE; WIDE TEMPERATURE RANGES; X-RAY DIFFRACTION DATA;

NANOSHEETS;

EID: 84903455100     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn502014c     Document Type: Article

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