Evidence of van Hove singularities in ordered grain boundaries of graphene

Physical Review Letters

Volumn 112, Issue 22, 2014, Pages

  Ma, Chuanxu ^a   Sun, Haifeng ^a   Zhao, Yeliang ^a   Li, Bin ^a   Li, Qunxiang ^a   Zhao, Aidi ^a   Wang, Xiaoping ^a   Luo, Yi ^a   Yang, Jinlong ^a   Wang, Bing ^a   Hou, J G ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; SCANNING TUNNELING MICROSCOPY;

ELECTRON TRANSPORT; ELECTRONIC DEVICE; EXPERIMENTAL EVIDENCE; GRAPHENE NANO-RIBBON; ORDERED GRAIN BOUNDARIES; VAN HOVE SINGULARITIES;

GRAPHENE;

EID: 84902127344     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.112.226802     Document Type: Article

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