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Volumn 109, Issue 19, 2012, Pages

Erratum: Unraveling the intrinsic and robust nature of van hove singularities in twisted bilayer graphene by scanning tunneling microscopy and theoretical analysis (Physical Review Letters (2012) 109 (196802) DOI:10.1103/PhysRevLett.109.196802);Unraveling the intrinsic and robust nature of van hove singularities in twisted bilayer graphene by scanning tunneling microscopy and theoretical analysis

(9) Brihuega, I a Mallet, P b Gonzalez Herrero H a Trambly De Laissardiere G c Ugeda, M M a Magaud, L b Gomez Rodriguez J M a Yndurain F a Veuillen, J Y b

a UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

b CNRS (France)

c UNIVERSITÉ DE CERGY PONTOISE (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE;

INTER-LAYER COUPLINGS; INTERLAYER DISTANCE; INTERLAYER INTERACTIONS; PERIODIC MODULATION; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; TIGHT-BINDING CALCULATIONS; TOPOGRAPHIC CORRUGATION; VAN HOVE SINGULARITIES;

GRAPHENE;

EID: 84869053057 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.109.209905 Document Type: Erratum

Times cited : (518)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.