Atomic-scale evidence for potential barriers and strong carrier scattering at graphene grain boundaries: A scanning tunneling microscopy study

ACS Nano

Volumn 7, Issue 1, 2013, Pages 75-86

  Koepke, Justin C ^a   Wood, Joshua D ^a,b   Estrada, David ^a,b   Ong, Zhun Yong ^b   He, Kevin T ^a   Pop, Eric ^a,b   Lyding, Joseph W ^a,b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

CVD; grain boundaries; graphene; scanning tunneling microscopy; scattering; spectroscopy

Indexed keywords

ATOMIC SCALE; CARRIER SCATTERING; CU FOIL; DECAY LENGTH; DOMINANT MECHANISM; ELECTRONIC NATURES; EMPTYSTATE; INTERVALLEY SCATTERING; MOBILITY REDUCTION; POLYCRYSTALLINE; POTENTIAL BARRIERS; PREFERENTIAL ORIENTATION; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SCANNING TUNNELING SPECTROSCOPY; STANDING WAVE PATTERNS; TUNNELING CONDUCTANCE;

CHEMICAL VAPOR DEPOSITION; FOURIER ANALYSIS; GRAIN BOUNDARIES; METAL CLADDING; SCANNING TUNNELING MICROSCOPY; SCATTERING; SPECTROSCOPY;

GRAPHENE;

GRAPHITE; NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRON TRANSPORT; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

ELECTRON TRANSPORT; GRAPHITE; MATERIALS TESTING; MICROSCOPY, SCANNING TUNNELING; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SURFACE PROPERTIES;

MLCS; MLOWN;

EID: 84872864051     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn302064p     Document Type: Article

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