Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB laser diodes using weak drift of monitored parameters during ageing tests

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1337-1342

  Mendizabal, L ^a   Bechou, L ^a   Deshayes, Y ^a   Verdier, F ^a   Danto, Y ^a   Laffitte, D ^b   Goudard, J L ^b   Houe F ^b  

^a UNIVERSITÉ BORDEAUX 1   (France)

^b Avanex France   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTED FEEDBACK LASERS; ELECTRIC CURRENTS; FAILURE (MECHANICAL); LIGHT AMPLIFIERS; PHOTODIODES; RELIABILITY; SIGNAL RECEIVERS; TELECOMMUNICATION SYSTEMS;

AGEING TESTS; FAILURE MODES; LIFETIME DISTRIBUTION;

SEMICONDUCTOR LASERS;

EID: 4544272628     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.025     Document Type: Conference Paper

References (8)

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