Lifetime predictions of LED-based light bars by accelerated degradation test

Microelectronics Reliability

Volumn 52, Issue 7, 2012, Pages 1332-1336

  Wang, Fu Kwun ^a   Chu, Tao Peng ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED DEGRADATION; ACCELERATED DEGRADATION TESTS; DEGRADATION BEHAVIOR; FAILURE CRITERIA; FAILURE TIME; JUNCTION TEMPERATURES; LIFETIME PREDICTION; OPERATING CONDITION; OPTICAL POWER; PARAMETER VARIATION; RESPONSE MODEL; USEFUL LIFETIME;

DEGRADATION; LAPTOP COMPUTERS; LIGHT SOURCES;

LIGHT EMITTING DIODES;

EID: 84861794326     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2012.02.019     Document Type: Article

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