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Volumn 5, Issue 4, 2005, Pages 688-693
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Analysis of DC current accelerated life tests of GaN LEDs using a weibull-based statistical model
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Author keywords
Gallium compounds; Light emitting diodes; Reliability estimation; Stress; Weibull distributions
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Indexed keywords
DC CURRENTS;
RELIABILITY ESTIMATION;
SEMICONDUCTING GALLIUM COMPOUNDS;
STATISTICAL METHODS;
STRESS ANALYSIS;
WEIBULL DISTRIBUTION;
LIGHT EMITTING DIODES;
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EID: 31044444581
PISSN: 15304388
EISSN: 15304388
Source Type: Journal
DOI: 10.1109/TDMR.2005.860817 Document Type: Article |
Times cited : (37)
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References (7)
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