Accelerated life test for high-power white LED based on spectroradiometric measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6841, Issue , 2008, Pages

  Shen, Haiping ^a   Pan, Jiangen ^b   Feng, Huajun ^a  

^a ZHEJIANG UNIVERSITY   (China)

^b Everfine Photo E Info Co Ltd   (China)

Author keywords

Accelerated life test; Lifetime; Reliability indicator; Spectroradiometric measurement; White LED

Indexed keywords

COLOR; DEGRADATION; LIGHT EMISSION; LIGHTING; LUMINESCENCE; OPTICAL PROPERTIES; PHOSPHORS; RELIABILITY; RENEWABLE ENERGY RESOURCES; SOLAR RADIATION; TESTING;

ACCELERATED LIFE TEST; LIFETIME; RELIABILITY INDICATOR; SPECTRORADIOMETRIC MEASUREMENT; WHITE LED;

SOLAR ENERGY;

EID: 47949111956     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.755708     Document Type: Conference Paper

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