The five parameter grain boundary character distribution of polycrystalline silicon

Journal of Materials Science

Volumn 49, Issue 14, 2014, Pages 4938-4945

  Ratanaphan, Sutatch ^a,d   Yoon, Yohan ^b,c   Rohrer, Gregory S ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b North Carolina State University   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d KING MONGKUT'S UNIVERSITY OF TECHNOLOGY THONBURI   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; POLYSILICON;

BOUNDARY POPULATION; DISTRIBUTION OF GRAINS; ELECTRON BACK SCATTER DIFFRACTION; GRAIN BOUNDARY CHARACTER DISTRIBUTIONS; GRAIN BOUNDARY TYPES; GRAIN-BOUNDARY ENERGY; STEREOLOGICAL ANALYSIS; TWIST BOUNDARIES;

GRAIN BOUNDARIES;

EID: 84900477867     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-014-8195-2     Document Type: Article

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