|
Volumn 58, Issue 15, 2010, Pages 5063-5069
|
Comparing calculated and measured grain boundary energies in nickel
|
Author keywords
EBSD; Grain boundary energy; Grain boundary junctions; MD simulations; Serial sectioning
|
Indexed keywords
BOUNDARY ENERGIES;
COMPUTATIONAL DATA;
COMPUTATIONAL STUDIES;
CSL BOUNDARY;
EXPERIMENTAL SYSTEM;
GRAIN-BOUNDARY ENERGY;
LARGE-GRAIN;
MICRO-STRUCTURAL;
SERIAL SECTIONING;
GRAIN SIZE AND SHAPE;
SEMICONDUCTOR JUNCTIONS;
GRAIN BOUNDARIES;
|
EID: 77955425439
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.05.042 Document Type: Article |
Times cited : (110)
|
References (45)
|