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Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 35 A, Issue 7, 2004, Pages 1981-1989

Measuring the five-parameter grain-boundary distribution from observations of planar sections

(4) Saylor, David M a El Dasher, Bassem S b Adams, Brent L c Rohrer, Gregory S d

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

c Department of Electrical and Computer Engineering (United States)

d CARNEGIE MELLON UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; GRAIN BOUNDARIES; MATERIALS TESTING; POLYCRYSTALS; STEREOCHEMISTRY; STRONTIUM COMPOUNDS;

GRAIN BOUNDARY DISTRIBUTION; LATTICE MISORIENTATION; STEREOLOGICAL METHOD;

POLYCRYSTALLINE MATERIALS;

EID: 3242889204 PISSN: 10735623 EISSN: None Source Type: Journal
DOI: 10.1007/s11661-004-0147-z Document Type: Article

Times cited : (201)

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