Probing deeper by hard x-ray photoelectron spectroscopy

Applied Physics Letters

Volumn 104, Issue 5, 2014, Pages

  Risterucci, P ^a   Renault, O ^a   Martinez, E ^a   Detlefs, B ^a,b   Delaye, V ^a   Zegenhagen, J ^b,f   Gaumer, C ^c   Grenet, G ^d   Tougaard, S ^e  

^a CEA GRENOBLE   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c STMICROELECTRONICS   (France)

^d ECOLE CENTRALE DE LYON   (France)

^e UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

^f DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORE LEVELS; ENERGY DISSIPATION; PHOTOELECTRONS; PHOTONS; SPECTROSCOPIC ANALYSIS; X RAYS;

BURIED LAYER; CONVENTIONAL APPROACH; CORE-LEVEL PEAKS; DEPTH DISTRIBUTION; ENERGY LOSS FEATURE; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HIGH SENSITIVITY; PLASMON LOSS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84899879570     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4864488     Document Type: Article

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