X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32

Journal of Electron Spectroscopy and Related Phenomena

Volumn 178-179, Issue C, 2010, Pages 258-267

  Zegenhagen, Jörg ^a   Detlefs, Blanka ^a   Lee, Tien Lin ^a   Thiess, Sebastian ^a   Isern, Helena ^a   Petit, Lucien ^a   André, Lionel ^a   Roy, Jérôme ^a   Mi, Yanyu ^a   Joumard, Isabelle ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Fourier analysis; Hard X ray photoelectron spectroscopy; Photoelectric multipole contributions; Synchrotron radiation; X ray standing waves

Indexed keywords

BEAM LINES; CHEMICAL COMPOSITIONS; COMPOUND REFRACTIVE LENS; FRESNEL ZONE PLATE; GEOMETRICAL STRUCTURE; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HIGH RESOLUTION; INSERTION DEVICE; MONOCHROMATIC BEAM; MULTIPOLES; PHOTOELECTRIC MULTIPOLE CONTRIBUTIONS; PHOTON ENERGY RANGE; SELECTED EXAMPLES; SURFACE X-RAY DIFFRACTION; SURFACES AND INTERFACES; UNIQUE FEATURES; X-RAY STANDING WAVE TECHNIQUES; X-RAY STANDING WAVES;

ELASTIC WAVES; ELECTRONIC PROPERTIES; FOURIER ANALYSIS; PHOTOELECTRICITY; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS; SPECTRUM ANALYSIS; SYNCHROTRON RADIATION; SYNCHROTRONS; WAVES; X RAY ANALYSIS; X RAY DIFFRACTION; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77951022512     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.09.008     Document Type: Article

References (46)

1. Batterman B.W. Phys. Rev. Lett. 22 (1969) 703
2. Zegenhagen J. Surf. Sci. Rep. 18 (1993) 199
3. See e.g.:. Siegbahn K. Nucl. Instrum. Meth. Phys. Res. A 547 (2005) 1 and references therein
4. Pianetta P., and Lindau I. Nature 250 (1974) 214
5. See e.g.:. Dallera C., Braicovich L., Duo L., Palenzona A., Panaccione G., Paolicelli G., Cowie B.C.C., and Zegenhagen J. Nucl. Instrum. Meth. Phys. Res. A 547 (2005) 113 and references therein
6. See e.g.: T. Ishikawa, K. Tamasaku, M. Yabashi, Nucl. Instrum. Meth. A 547, and references therein.
7. Rubio-Zuazo J., and Castro G. Rev. Adv. Mater. Sci. 15 (2007) 79
8. Hertel N., Materlik G., and Zegenhagen J. Z. Phys. B 58 (1985) 199
9. Bedzyk M.J., and Materlik G. Phys. Rev. B 32 (1985) 6456
10. Max v. Laue, Röntgenstrahl-Interferenzen (Akademische Verlagsgesellschaft, Beccker & ErlerKolm.-Ges., Leipzig, 1941); Röntgenstrahl-Interferenzen (Akademische Verlagsgesellschaft, Frankfurt, 1960).
11. Zegenhagen J., Materlik G., and Uelhoff W. J. X-ray Sci. Technol. 2 (1990) 214
12. Vartanyants I.A., and Zegenhagen J. Solid State Commun. 113 (1999) 299
13. Vartanyants I.A., Lee T.-L., Thiess S., and Zegenhagen J. Nucl. Instrum. Meth. Phys. Res. A 547 (2005) 196
14. Trzhaskovskaya M.B., Nikulin V.K., Nefedov V.I., and Yarzhemsky V.G. At. Data Nucl. Data Tables 92 (2006) 245
15. Woodruff D.P. Nucl. Instrum. Meth. Phys. Res. A 547 (2005) 187
16. Vartanyants I.A., and Zegenhagen J. Nuovo Cimento 19D (1997) 617
17. Comin F., De Martino R., Fezzaa K., Formoso V., Ortega L., and Signorato R. J. Phys. IV 7 (1997) C2/343
18. CINEL Strumenti Scientifici s.r.l., via dell'Artigianato, 14-14/A, 35010 Vigonza (Padova), Italy, http://www.cinel.com.
19. e.g.:. Snigirev A., Kohn V., Snigireva I., and Lengeler B. Nature 384 (1996) 49
20. Snigirev A., Kohn V., Snigireva I., Souvorov A., and Lengeler B. Appl. Opt. 37 (1998) 653
21. HUBER Diffraktionstechnik GmbH & Co. KG, Sommerstrasse 4, D-83253 Rimsting, Germany, http://www.xhuber.de.
22. VG-Scienta Ltd., Maunsell Road, Castleham Industrial Estate, Hastings, East Sussex, TN38 9NN, United Kingdom, http://www.vgscienta.com/.
23. Surface Concept GmbH, Staudingerweg 7, D-55128 Mainz, Germany, http://www.surface-concept.com/.
24. Kobayashi K., Yabashi M., Takata Y., Tokushima T., Shin S., Tamasaku K., Miwa D., Ishikawa T., Nohira H., Hattori T., Sugita Y., Nakatsuka O., Sakai A., and Zaima S. Appl. Phys. Lett. 83 (2003) 1005
25. Dallera C., Duo L., Braicovich L., Panaccione G., Paolicelli G., Cowie B.C.C., and Zegenhagen J. Appl. Phys. Lett. 85 (2004) 4532
26. J. Zegenhagen, C. Kunz (Eds.), Proc. of the Workshop on Hard X-ray Photoelectron Spectroscopy, Grenoble 2003; Nucl. Instrum. Meth. Phys. Res. A 547 (2005).
27. Thiess S., Kunz C., Cowie B.C.C., Lee T.-L., Renier M., and Zegenhagen J. Solid State Commun. 132 (2004) 589
28. Kunz C., Thiess S., Cowie B.C.C., Lee T.-L., and Zegenhagen J. Nucl. Instrum. Meth. Phys. Res. A 547 (2005) 73
29. Martinez E., Renault O., Clavelier L., Le Royer C., Cosnier V., Hartmann J.-M., Zegenhagen J., Lee T.-L., Campidelli Y., Loup V., and Minoret S. J. Vac. Sci. Technol. B 25 (2007) 86
30. Libralesso L., Lee T.-L., and Zegenhagen J. Appl. Phys. Lett. 90 (2007) 222905
31. Kunz C., Cowie B.C.C., Drube W., Lee T.-L., Thiess S., Wild C., and Zegenhagen J. J. Electron Spectrosc. Relat. Phenom. 173 (2009) 29
32. J.H. Scofield, Lawrence Livermore National Laboratory Report UCRL-51326, 1973.
33. Takata Y., et al. Appl. Phys. Lett. 84 (2004) 4310
34. SPECS GmbH, Voltastrasse 5, D-13355 Berlin, Germany, http://www.specs.de.
35. Sugiyama M., Maeyama S., Heun S., and Oshima M. Phys. Rev. B 51 (1995) 14778
36. Jackson G.J., Lüdecke J., Woodruff D.P., Chan A.S.Y., Singh N.K., McCombie J., Jones R.G., Cowie B.C.C., and Formoso V. Surf. Sci. 441 (1999) 515
37. Jackson G.J., Woodruff D.P., Jones R.G., Singh N.K., Chan A.S.Y., Cowie B.C.C., and Formoso V. Phys. Rev. Lett. 84 (2000) 119
38. See e.g.:. Hauschild A., Karki K., Cowie B.C.C., Rohlfing M., Tautz F.S., and Sokolowski M. Phys. Rev. Lett. 94 (2005) 036106
39. Lee T.-L., Warren S., Cowie B.C.C., and Zegenhagen J. Phys. Rev. Lett. 96 (2006) 046103
40. Avila J., Mascaraque A., Michel E.G., Asensio M.C., LeLay G., Ortega J., Pérez R., and Flores F. Phys. Rev. Lett. 82 (1999) 442
41. Stumpf R.R., Carpinelli J.M., and Weitering H.H. Phys. Rev. B 59 (1999) 15779
42. Pérez R., Ortega J., and Flores F. Phys. Rev. Lett. 86 (2001) 4891
43. Cheng L., Fenter P., Bedzyk M.J., and Sturchio N.C. Phys. Rev. Lett. 90 (2003) 255503
44. S. Thiess, PhD thesis, University Hamburg, 2007.
45. S. Thiess, T.L. Lee, F. Bottin, J. Zegenhagen, in press.
46. Haage T., Zegenhagen J., Habermeier H.-U., and Cardona M. Phys. Rev. Lett. 80 (1998) 4225